Multiple Andreev reflections in diffusive SINIS and SIFIS junctions

Multiple Andreev reflections in diffusive SINIS and SIFIS junctions

Blog Article

We study Multiple Andreev Reflections in long diffusive superconductor(S)-normal metal(N)-superconductor junctions with low-transparency interfaces.Assuming strong thermalization in the weak link, we calculate the current-voltage dependence $I(V)$.At Glass Markers intermediate temperatures, $arepsilon_mathrm{Th}ll TllDelta$, the current is dominated by noncoherent multiple Andreev reflections and is obtained analytically.The results are generalized to a ferromagnetic junction.We find that the exchange field produces a non-trivial splitting of the subharmonic gap structure.

This effect relies on thermalization and vanishes in SFS junctions with no energy relaxation in Lunch Boxes the weak link.